TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_34_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-006-04 | FUSED_ID : 6359364768386547812
  IC_TEMP :  -62.64 | VDDM : 1098.55 | AUX_INT :  -10.11 | CsaBias :   65.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62053e-03 / 2
  ADC_P0  : -1.01077e-02 ± 2.72936e-02
  ADC_P1  : 8.50357e-03 ± 6.74362e-04
  ADC_P2  : -5.91505e-06 ± 3.32557e-06
  CSA_Chi2/NDF : 1.74606e-04 / 2
  CSA_P0  : 5.80385e-02 ± 8.81356e-03
  CSA_P1  : 1.00112e-02 ± 6.64038e-04
  CSA_P2  : -5.45439e-05 ± 1.01125e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 8, 10, 36, 50, 83, 85, 109, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 9, 10, 11, 16, 20, 54, 84, 90, 113, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1142', '1.800', '0.1370', '1.799', '0.0847', '7.000', '0.7075', 1, 1, 1, 1, 1724690045.115938]
VI_after__Init : ['1.202', '0.1142', '1.800', '0.1370', '1.800', '0.0795', '7.000', '0.7076', 1, 1, 1, 1, 1724690053.9292417]
VI_at__the_End : ['1.201', '0.4653', '1.800', '0.1351', '1.803', '0.1154', '7.000', '0.7081', 1, 1, 1, 1, 1724690114.168414]