TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_40_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-010-04 | FUSED_ID : 6359364768386547876
  IC_TEMP :  -63.71 | VDDM : 1127.80 | AUX_INT :   -6.82 | CsaBias :   61.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.05289e-04 / 2
  ADC_P0  : -6.81783e-03 ± 2.03474e-02
  ADC_P1  : 8.60895e-03 ± 5.13745e-04
  ADC_P2  : -6.36884e-06 ± 2.55868e-06
  CSA_Chi2/NDF : 1.83644e-04 / 2
  CSA_P0  : 5.80777e-02 ± 9.03879e-03
  CSA_P1  : 1.00937e-02 ± 6.81008e-04
  CSA_P2  : -5.44268e-05 ± 1.03709e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [11, 25, 49, 56, 57, 58, 74, 75, 92, 96, 105, 112, 114, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [0, 5, 11, 16, 23, 37, 38, 44, 56, 85, 87, 97, 110, 120, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1425', '1.800', '0.1561', '1.799', '0.0890', '6.997', '0.7083', 1, 1, 1, 1, 1724690427.8557978]
VI_after__Init : ['1.201', '0.1424', '1.800', '0.1560', '1.800', '0.0819', '7.000', '0.7076', 1, 1, 1, 1, 1724690436.5220785]
VI_at__the_End : ['1.201', '0.4733', '1.800', '0.1373', '1.803', '0.1158', '7.000', '0.7083', 1, 1, 1, 1, 1724690502.7698624]