TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_42_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-011-04 | FUSED_ID : 6359364768386547892
  IC_TEMP :  -59.76 | VDDM : 1123.39 | AUX_INT :  -10.61 | CsaBias :   59.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76034e-03 / 2
  ADC_P0  : -1.06104e-02 ± 2.84457e-02
  ADC_P1  : 8.87868e-03 ± 7.29107e-04
  ADC_P2  : -6.63377e-06 ± 3.73034e-06
  CSA_Chi2/NDF : 1.57305e-04 / 2
  CSA_P0  : 5.96158e-02 ± 8.36553e-03
  CSA_P1  : 1.00804e-02 ± 6.30282e-04
  CSA_P2  : -5.46087e-05 ± 9.59845e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [17, 22, 43, 63, 66, 67, 83, 94, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [21, 39, 48, 57, 90, 105, 108, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4496', '1.800', '0.1460', '1.799', '0.0957', '7.000', '0.7079', 1, 1, 1, 1, 1724690523.4831316]
VI_after__Init : ['1.201', '0.4505', '1.800', '0.1469', '1.801', '0.0902', '7.000', '0.7077', 1, 1, 1, 1, 1724690531.7805438]
VI_at__the_End : ['1.201', '0.4713', '1.800', '0.1381', '1.800', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1724690598.686332]