TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_45_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-013-04 | FUSED_ID : 6359364768386547924
  IC_TEMP :  -62.37 | VDDM : 1118.97 | AUX_INT :   -9.43 | CsaBias :   60.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28986e-03 / 2
  ADC_P0  : -9.42816e-03 ± 2.43006e-02
  ADC_P1  : 8.72832e-03 ± 6.16988e-04
  ADC_P2  : -6.19595e-06 ± 3.12903e-06
  CSA_Chi2/NDF : 1.99790e-04 / 2
  CSA_P0  : 5.91110e-02 ± 9.42778e-03
  CSA_P1  : 1.08266e-02 ± 7.10315e-04
  CSA_P2  : -6.67927e-05 ± 1.08173e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [19, 24, 28, 31, 48, 52, 68, 72, 74, 79, 83, 86, 95, 108, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [17, 18, 27, 29, 36, 53, 64, 67, 72, 78, 85, 89, 95, 103, 109, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2047', '1.800', '0.1338', '1.799', '0.0886', '7.001', '0.7079', 1, 1, 1, 1, 1724690714.59834]
VI_after__Init : ['1.202', '0.2047', '1.800', '0.1338', '1.801', '0.0830', '7.000', '0.7079', 1, 1, 1, 1, 1724690722.7696702]
VI_at__the_End : ['1.201', '0.4730', '1.800', '0.1386', '1.802', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1724690790.194335]