TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_48_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-015-04 | FUSED_ID : 6359364768386547956
  IC_TEMP :  -57.83 | VDDM : 1125.56 | AUX_INT :   -8.31 | CsaBias :   60.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10208e-03 / 2
  ADC_P0  : -8.30610e-03 ± 2.24898e-02
  ADC_P1  : 8.65986e-03 ± 5.75633e-04
  ADC_P2  : -5.79397e-06 ± 2.93112e-06
  CSA_Chi2/NDF : 1.80970e-04 / 2
  CSA_P0  : 5.96282e-02 ± 8.97276e-03
  CSA_P1  : 1.04887e-02 ± 6.76033e-04
  CSA_P2  : -5.83943e-05 ± 1.02952e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 4, 9, 14, 45, 50, 61, 71, 79, 83, 85, 86, 96, 105, 106, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [16, 35, 45, 46, 49, 52, 70, 89, 92, 99, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4197', '1.800', '0.1789', '1.800', '0.0984', '7.000', '0.7077', 1, 1, 1, 1, 1724690906.3353407]
VI_after__Init : ['1.201', '0.4202', '1.800', '0.1791', '1.801', '0.0925', '7.000', '0.7077', 1, 1, 1, 1, 1724690914.406619]
VI_at__the_End : ['1.201', '0.4867', '1.799', '0.1398', '1.803', '0.1130', '7.000', '0.7086', 1, 1, 1, 1, 1724690981.958335]