TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_51_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-017-03 | FUSED_ID : 6359364768386547987
  IC_TEMP :  -56.74 | VDDM : 1106.78 | AUX_INT :   -8.61 | CsaBias :   67.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13806e-03 / 2
  ADC_P0  : -8.61240e-03 ± 2.28210e-02
  ADC_P1  : 8.54463e-03 ± 5.66762e-04
  ADC_P2  : -6.19836e-06 ± 2.79677e-06
  CSA_Chi2/NDF : 1.58674e-04 / 2
  CSA_P0  : 6.12534e-02 ± 8.40186e-03
  CSA_P1  : 1.03948e-02 ± 6.33019e-04
  CSA_P2  : -5.73610e-05 ± 9.64013e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [8, 9, 12, 17, 20, 25, 58, 67, 79, 87, 94, 112, 115, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [8, 22, 31, 32, 41, 48, 51, 58, 74, 79, 80, 87, 89, 97, 108, 109, 116, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2928', '1.800', '0.1705', '1.800', '0.0898', '7.000', '0.7075', 1, 1, 1, 1, 1724691097.7267194]
VI_after__Init : ['1.201', '0.2929', '1.800', '0.1706', '1.800', '0.0845', '7.000', '0.7073', 1, 1, 1, 1, 1724691105.7922533]
VI_at__the_End : ['1.201', '0.4855', '1.800', '0.1389', '1.804', '0.1135', '7.000', '0.7082', 1, 1, 1, 1, 1724691172.3081894]