TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_54_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-019-03 | FUSED_ID : 6359364768386548019
  IC_TEMP :  -56.69 | VDDM : 1130.07 | AUX_INT :   -7.37 | CsaBias :   69.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01931e-03 / 2
  ADC_P0  : -7.37024e-03 ± 2.16387e-02
  ADC_P1  : 8.61028e-03 ± 5.55089e-04
  ADC_P2  : -5.61376e-06 ± 2.82372e-06
  CSA_Chi2/NDF : 1.61067e-04 / 2
  CSA_P0  : 5.97982e-02 ± 8.46496e-03
  CSA_P1  : 1.01729e-02 ± 6.37774e-04
  CSA_P2  : -5.28385e-05 ± 9.71254e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [13, 14, 31, 32, 36, 52, 54, 55, 56, 71, 94, 95, 119, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [13, 22, 30, 43, 59, 60, 88, 92, 109, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4230', '1.800', '0.1843', '1.800', '0.0950', '7.000', '0.7072', 1, 1, 1, 1, 1724691290.6487455]
VI_after__Init : ['1.201', '0.4238', '1.800', '0.1843', '1.802', '0.0891', '7.000', '0.7072', 1, 1, 1, 1, 1724691299.5071595]
VI_at__the_End : ['1.201', '0.4864', '1.800', '0.1404', '1.800', '0.1131', '7.000', '0.7081', 1, 1, 1, 1, 1724691363.7260973]