TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_59_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-022-03 | FUSED_ID : 6359364768386548067
  IC_TEMP :  -51.32 | VDDM : 1121.38 | AUX_INT :   -8.76 | CsaBias :   76.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44392e-03 / 2
  ADC_P0  : -8.75894e-03 ± 2.58123e-02
  ADC_P1  : 8.55180e-03 ± 6.58636e-04
  ADC_P2  : -5.22598e-06 ± 3.34831e-06
  CSA_Chi2/NDF : 1.40192e-04 / 2
  CSA_P0  : 6.04215e-02 ± 7.89739e-03
  CSA_P1  : 9.97308e-03 ± 5.95012e-04
  CSA_P2  : -4.82360e-05 ± 9.06132e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [13, 15, 22, 26, 27, 34, 43, 44, 49, 52, 66, 70, 74, 75, 114, 117, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [12, 20, 21, 29, 34, 88, 97, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3788', '1.800', '0.1383', '1.799', '0.0937', '7.000', '0.7082', 1, 1, 1, 1, 1724691577.77148]
VI_after__Init : ['1.201', '0.3791', '1.800', '0.1381', '1.800', '0.0866', '7.000', '0.7072', 1, 1, 1, 1, 1724691585.9109137]
VI_at__the_End : ['1.201', '0.4930', '1.800', '0.1384', '1.799', '0.1103', '7.000', '0.7079', 1, 1, 1, 1, 1724691653.9712012]