TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_47_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-003-09 | FUSED_ID : 6359364768386551865
  IC_TEMP :  -61.60 | VDDM : 1116.94 | AUX_INT :   -8.74 | CsaBias :   60.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17140e-03 / 2
  ADC_P0  : -8.73717e-03 ± 2.31682e-02
  ADC_P1  : 8.70076e-03 ± 5.89623e-04
  ADC_P2  : -6.13572e-06 ± 2.98765e-06
  CSA_Chi2/NDF : 2.00565e-04 / 2
  CSA_P0  : 5.95736e-02 ± 9.44604e-03
  CSA_P1  : 1.04938e-02 ± 7.11691e-04
  CSA_P2  : -6.02655e-05 ± 1.08382e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 12, 13, 19, 25, 30, 31, 45, 52, 66, 75, 87, 92, 97, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [13, 21, 23, 26, 31, 43, 46, 48, 51, 59, 72, 83, 91, 92, 111, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1952', '1.800', '0.1709', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1724694446.9938202]
VI_after__Init : ['1.202', '0.1953', '1.800', '0.1712', '1.800', '0.0774', '7.001', '0.7079', 1, 1, 1, 1, 1724694455.9861574]
VI_at__the_End : ['1.202', '0.4726', '1.799', '0.1377', '1.799', '0.1163', '7.000', '0.7087', 1, 1, 1, 1, 1724694514.5274956]