TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_44_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-005-09 | FUSED_ID : 6359364768386551897
  IC_TEMP :  -60.21 | VDDM : 1117.83 | AUX_INT :   -9.87 | CsaBias :   74.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45034e-03 / 2
  ADC_P0  : -9.86955e-03 ± 2.57819e-02
  ADC_P1  : 8.47380e-03 ± 6.31347e-04
  ADC_P2  : -6.07606e-06 ± 3.08417e-06
  CSA_Chi2/NDF : 1.74034e-04 / 2
  CSA_P0  : 5.86221e-02 ± 8.79913e-03
  CSA_P1  : 9.89788e-03 ± 6.62951e-04
  CSA_P2  : -5.22405e-05 ± 1.00960e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [24, 25, 29, 33, 39, 49, 60, 73, 79, 92, 95, 104, 113, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [7, 15, 18, 31, 40, 41, 54, 67, 68, 72, 84, 110, 122, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3431', '1.800', '0.1304', '1.800', '0.0971', '7.000', '0.7084', 1, 1, 1, 1, 1724694255.1479797]
VI_after__Init : ['1.201', '0.3428', '1.800', '0.1304', '1.801', '0.0898', '7.000', '0.7077', 1, 1, 1, 1, 1724694263.5014765]
VI_at__the_End : ['1.201', '0.4722', '1.800', '0.1346', '1.805', '0.1138', '7.000', '0.7086', 1, 1, 1, 1, 1724694324.0165982]