TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_41_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-007-09 | FUSED_ID : 6359364768386551929
  IC_TEMP :  -58.84 | VDDM : 1118.50 | AUX_INT :   -7.94 | CsaBias :   66.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 1.70130e-04 / 2
  CSA_P0  : 5.85069e-02 ± 8.69988e-03
  CSA_P1  : 9.72128e-03 ± 6.55473e-04
  CSA_P2  : -4.97972e-05 ± 9.98208e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 23, 26, 67, 77, 78, 92, 106, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 16, 19, 26, 40, 43, 47, 56, 73, 91, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3271', '1.800', '0.1650', '1.799', '0.1003', '7.000', '0.7083', 1, 1, 1, 1, 1724694062.5394628]
VI_after__Init : ['1.202', '0.3277', '1.800', '0.1651', '1.801', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1724694071.4056942]
VI_at__the_End : ['1.201', '0.4709', '1.800', '0.1363', '1.808', '0.1143', '7.000', '0.7086', 1, 1, 1, 1, 1724694138.484329]