TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_29_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-014-09 | FUSED_ID : 6359364768386552041
  IC_TEMP :  -59.61 | VDDM : 1118.98 | AUX_INT :   -9.45 | CsaBias :   60.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41462e-03 / 2
  ADC_P0  : -9.44525e-03 ± 2.54717e-02
  ADC_P1  : 8.79468e-03 ± 6.48376e-04
  ADC_P2  : -6.65563e-06 ± 3.28208e-06
  CSA_Chi2/NDF : 1.84151e-04 / 2
  CSA_P0  : 5.92860e-02 ± 9.05127e-03
  CSA_P1  : 1.05080e-02 ± 6.81948e-04
  CSA_P2  : -5.99103e-05 ± 1.03853e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [3, 9, 16, 26, 56, 60, 73, 83, 99, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [23, 37, 42, 60, 79, 83, 90, 97, 100, 104, 105, 106, 121, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3712', '1.800', '0.1408', '1.799', '0.0961', '7.000', '0.7082', 1, 1, 1, 1, 1724693392.6601267]
VI_after__Init : ['1.201', '0.3716', '1.800', '0.1410', '1.800', '0.0886', '7.000', '0.7072', 1, 1, 1, 1, 1724693400.7104023]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1398', '1.805', '0.1149', '7.000', '0.7082', 1, 1, 1, 1, 1724693468.6485002]