TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_26_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-016-14 | FUSED_ID : 6359364768386552078
  IC_TEMP :  -62.11 | VDDM : 1128.06 | AUX_INT :   -9.84 | CsaBias :   67.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63486e-03 / 2
  ADC_P0  : -9.83610e-03 ± 2.74154e-02
  ADC_P1  : 8.67231e-03 ± 6.89458e-04
  ADC_P2  : -6.33706e-06 ± 3.45109e-06
  CSA_Chi2/NDF : 1.60313e-04 / 2
  CSA_P0  : 5.85049e-02 ± 8.44513e-03
  CSA_P1  : 1.03557e-02 ± 6.36280e-04
  CSA_P2  : -5.73530e-05 ± 9.68979e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 6, 8, 14, 15, 18, 42, 59, 65, 66, 92, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [11, 25, 33, 34, 43, 55, 58, 68, 88, 91, 96, 108, 110, 112, 113, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3367', '1.800', '0.1617', '1.799', '0.0915', '7.000', '0.7082', 1, 1, 1, 1, 1724693200.633256]
VI_after__Init : ['1.201', '0.3368', '1.800', '0.1617', '1.802', '0.0842', '7.000', '0.7072', 1, 1, 1, 1, 1724693209.478438]
VI_at__the_End : ['1.201', '0.4760', '1.800', '0.1386', '1.802', '0.1146', '7.000', '0.7081', 1, 1, 1, 1, 1724693271.126844]