TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_21_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-019-14 | FUSED_ID : 6359364768386552126
  IC_TEMP :  -68.86 | VDDM : 1127.91 | AUX_INT :   -8.08 | CsaBias :   53.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01596e-03 / 2
  ADC_P0  : -8.07748e-03 ± 2.15349e-02
  ADC_P1  : 8.86409e-03 ± 5.51093e-04
  ADC_P2  : -7.10124e-06 ± 2.79157e-06
  CSA_Chi2/NDF : 1.36808e-04 / 2
  CSA_P0  : 5.99700e-02 ± 7.80150e-03
  CSA_P1  : 9.91820e-03 ± 5.87787e-04
  CSA_P2  : -5.40373e-05 ± 8.95130e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 17, 21, 26, 37, 43, 74, 82, 92, 107, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 22, 23, 32, 55, 59, 60, 66, 67, 74, 85, 103, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3177', '1.800', '0.1136', '1.799', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1724692912.8813646]
VI_after__Init : ['1.201', '0.3178', '1.799', '0.1135', '1.800', '0.0836', '7.000', '0.7069', 1, 1, 1, 1, 1724692920.9436812]
VI_at__the_End : ['1.201', '0.4662', '1.800', '0.1335', '1.803', '0.1181', '7.000', '0.7079', 1, 1, 1, 1, 1724692988.2696478]