TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_12_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-009-025-14 | FUSED_ID : 6359364768386552222
  IC_TEMP :  -59.34 | VDDM : 1123.67 | AUX_INT :   -9.62 | CsaBias :   65.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49334e-03 / 2
  ADC_P0  : -9.61782e-03 ± 2.62285e-02
  ADC_P1  : 8.43178e-03 ± 6.53794e-04
  ADC_P2  : -5.23256e-06 ± 3.25821e-06
  CSA_Chi2/NDF : 1.80052e-04 / 2
  CSA_P0  : 5.82501e-02 ± 8.94997e-03
  CSA_P1  : 1.05534e-02 ± 6.74316e-04
  CSA_P2  : -5.84463e-05 ± 1.02690e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [8, 11, 33, 54, 75, 82, 122, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [27, 37, 38, 42, 62, 71, 74, 82, 91, 97, 110, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2678', '1.800', '0.1407', '1.799', '0.0862', '6.999', '0.7072', 1, 1, 1, 1, 1724692337.6094067]
VI_after__Init : ['1.201', '0.2678', '1.800', '0.1408', '1.801', '0.0808', '7.000', '0.7072', 1, 1, 1, 1, 1724692345.776913]
VI_at__the_End : ['1.201', '0.4864', '1.800', '0.1371', '1.799', '0.1154', '7.000', '0.7079', 1, 1, 1, 1, 1724692411.6008916]