TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_52_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-003-07 | FUSED_ID : 6359364768386555959
  IC_TEMP :  -62.26 | VDDM : 1118.21 | AUX_INT :   -9.01 | CsaBias :   62.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49902e-03 / 2
  ADC_P0  : -9.01115e-03 ± 2.62129e-02
  ADC_P1  : 8.99488e-03 ± 6.77282e-04
  ADC_P2  : -7.44164e-06 ± 3.46091e-06
  CSA_Chi2/NDF : 1.89495e-04 / 2
  CSA_P0  : 5.90162e-02 ± 9.18165e-03
  CSA_P1  : 1.02166e-02 ± 6.91771e-04
  CSA_P2  : -5.43775e-05 ± 1.05349e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [10, 11, 36, 41, 42, 44, 52, 61, 65, 69, 79, 89, 106, 114, 115, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [14, 41, 55, 79, 81, 93, 106, 107, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2800', '1.800', '0.1683', '1.800', '0.0901', '7.000', '0.7083', 1, 1, 1, 1, 1724694733.5043156]
VI_after__Init : ['1.201', '0.2800', '1.800', '0.1684', '1.800', '0.0820', '7.000', '0.7078', 1, 1, 1, 1, 1724694741.7296624]
VI_at__the_End : ['1.201', '0.4813', '1.800', '0.1385', '1.799', '0.1167', '7.000', '0.7082', 1, 1, 1, 1, 1724694808.7273715]