TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_53_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-004-07 | FUSED_ID : 6359364768386555975
  IC_TEMP :  -59.60 | VDDM : 1116.52 | AUX_INT :   -8.45 | CsaBias :   59.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13696e-03 / 2
  ADC_P0  : -8.45408e-03 ± 2.28026e-02
  ADC_P1  : 8.55715e-03 ± 5.64478e-04
  ADC_P2  : -6.45940e-06 ± 2.76984e-06
  CSA_Chi2/NDF : 2.05933e-04 / 2
  CSA_P0  : 5.88712e-02 ± 9.57161e-03
  CSA_P1  : 9.92188e-03 ± 7.21152e-04
  CSA_P2  : -5.08453e-05 ± 1.09823e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 1, 8, 12, 17, 22, 43, 45, 49, 70, 73, 90, 111, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [9, 10, 28, 33, 38, 51, 73, 75, 80, 86, 92, 94, 105, 108, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2537', '1.800', '0.1666', '1.799', '0.0856', '7.000', '0.7074', 1, 1, 1, 1, 1724694829.601823]
VI_after__Init : ['1.201', '0.2537', '1.800', '0.1665', '1.802', '0.0797', '7.000', '0.7074', 1, 1, 1, 1, 1724694838.4540706]
VI_at__the_End : ['1.201', '0.4796', '1.800', '0.1367', '1.804', '0.1149', '7.001', '0.7079', 1, 1, 1, 1, 1724694905.3308165]