TEST_NAME : Wafer
TEST_DATE : 24_08_26-19_58_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-007-07 | FUSED_ID : 6359364768386556023
  IC_TEMP :  -55.23 | VDDM : 1118.50 | AUX_INT :   -7.94 | CsaBias :   66.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 1.36769e-04 / 2
  CSA_P0  : 5.85706e-02 ± 7.80038e-03
  CSA_P1  : 9.47092e-03 ± 5.87702e-04
  CSA_P2  : -4.51779e-05 ± 8.95001e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 8, 14, 20, 25, 41, 62, 73, 76, 79, 83, 90, 92, 98, 109, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [22, 28, 32, 43, 46, 58, 59, 62, 66, 76, 79, 83, 95, 102, 113, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3640', '1.800', '0.1586', '1.800', '0.0956', '7.000', '0.7070', 1, 1, 1, 1, 1724695117.0922055]
VI_after__Init : ['1.201', '0.3645', '1.800', '0.1587', '1.799', '0.0898', '7.001', '0.7071', 1, 1, 1, 1, 1724695125.1796434]
VI_at__the_End : ['1.201', '0.4714', '1.800', '0.1387', '1.802', '0.1128', '6.997', '0.7081', 1, 1, 1, 1, 1724695186.2240405]