TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_03_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-010-07 | FUSED_ID : 6359364768386556071
  IC_TEMP :  -66.24 | VDDM : 1121.00 | AUX_INT :   -9.83 | CsaBias :   51.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66111e-03 / 2
  ADC_P0  : -9.82639e-03 ± 2.76451e-02
  ADC_P1  : 8.83915e-03 ± 7.10237e-04
  ADC_P2  : -6.51230e-06 ± 3.63047e-06
  CSA_Chi2/NDF : 2.01770e-04 / 2
  CSA_P0  : 5.99160e-02 ± 9.47439e-03
  CSA_P1  : 1.03839e-02 ± 7.13827e-04
  CSA_P2  : -6.08391e-05 ± 1.08707e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [19, 40, 41, 49, 65, 73, 75, 92, 108, 113, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 25, 29, 32, 41, 44, 45, 58, 75, 78, 80, 88, 92, 100, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4214', '1.800', '0.1885', '1.799', '0.0962', '7.000', '0.7072', 1, 1, 1, 1, 1724695404.3884761]
VI_after__Init : ['1.201', '0.4226', '1.800', '0.1887', '1.800', '0.0901', '7.001', '0.7072', 1, 1, 1, 1, 1724695412.3659685]
VI_at__the_End : ['1.201', '0.4703', '1.800', '0.1406', '1.803', '0.1164', '6.998', '0.7080', 1, 1, 1, 1, 1724695479.982553]