TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_11_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-015-07 | FUSED_ID : 6359364768386556151
  IC_TEMP :  -51.50 | VDDM : 1126.40 | AUX_INT :  -37.18 | CsaBias :   51.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -3.71803e-02 ± 3.00636e-02
  ADC_P1  : 8.93368e-03 ± 7.47200e-04
  ADC_P2  : -6.92644e-06 ± 3.69201e-06
  CSA_Chi2/NDF : 1.17293e-04 / 2
  CSA_P0  : 5.99973e-02 ± 7.22367e-03
  CSA_P1  : 9.75138e-03 ± 5.44251e-04
  CSA_P2  : -4.79750e-05 ± 8.28830e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [19, 31, 37, 40, 67, 70, 79, 82, 84, 86, 90, 95, 105, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [13, 24, 27, 30, 43, 44, 50, 53, 60, 63, 93, 94, 96, 114, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3590', '1.800', '0.1547', '1.799', '0.0997', '7.001', '0.7083', 1, 1, 1, 1, 1724695883.6925771]
VI_after__Init : ['1.201', '0.3594', '1.800', '0.1548', '1.801', '0.0924', '7.000', '0.7076', 1, 1, 1, 1, 1724695891.794108]
VI_at__the_End : ['1.201', '0.4782', '1.800', '0.1363', '1.799', '0.1126', '7.000', '0.7083', 1, 1, 1, 1, 1724695959.7271812]