TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_17_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-019-00 | FUSED_ID : 6359364768386556208
  IC_TEMP :  -56.19 | VDDM : 1125.33 | AUX_INT :   -8.09 | CsaBias :   68.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10798e-03 / 2
  ADC_P0  : -8.08669e-03 ± 2.25276e-02
  ADC_P1  : 8.52683e-03 ± 5.60736e-04
  ADC_P2  : -6.17439e-06 ± 2.76456e-06
  CSA_Chi2/NDF : 1.28930e-04 / 2
  CSA_P0  : 5.91546e-02 ± 7.57353e-03
  CSA_P1  : 9.88230e-03 ± 5.70611e-04
  CSA_P2  : -4.91140e-05 ± 8.68973e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [3, 19, 20, 23, 27, 47, 49, 51, 56, 61, 64, 86, 95, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [8, 14, 18, 22, 25, 26, 51, 53, 65, 71, 77, 100, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2278', '1.800', '0.1639', '1.799', '0.0923', '7.000', '0.7077', 1, 1, 1, 1, 1724696265.6459734]
VI_after__Init : ['1.202', '0.2278', '1.800', '0.1631', '1.801', '0.0864', '7.000', '0.7075', 1, 1, 1, 1, 1724696274.5322196]
VI_at__the_End : ['1.201', '0.4815', '1.801', '0.1385', '1.801', '0.1130', '7.000', '0.7083', 1, 1, 1, 1, 1724696333.7808402]