TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_30_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-010-027-00 | FUSED_ID : 6359364768386556336
  IC_TEMP :  -59.43 | VDDM : 1121.66 | AUX_INT :   -8.98 | CsaBias :   67.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34355e-03 / 2
  ADC_P0  : -8.98450e-03 ± 2.48341e-02
  ADC_P1  : 8.58952e-03 ± 6.22344e-04
  ADC_P2  : -6.10937e-06 ± 3.10038e-06
  CSA_Chi2/NDF : 1.63883e-04 / 2
  CSA_P0  : 5.60554e-02 ± 8.53866e-03
  CSA_P1  : 1.00010e-02 ± 6.43326e-04
  CSA_P2  : -4.96676e-05 ± 9.79710e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [2, 3, 35, 36, 43, 44, 48, 52, 54, 75, 82, 95, 102, 119, 124, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 9, 10, 11, 49, 67, 74, 78, 93, 107, 109, 115, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2005', '1.800', '0.1418', '1.799', '0.0940', '7.000', '0.7072', 1, 1, 1, 1, 1724697033.338559]
VI_after__Init : ['1.201', '0.2006', '1.800', '0.1413', '1.801', '0.0883', '7.000', '0.7071', 1, 1, 1, 1, 1724697041.3999553]
VI_at__the_End : ['1.201', '0.4818', '1.800', '0.1344', '1.806', '0.1147', '7.000', '0.7079', 1, 1, 1, 1, 1724697108.7649539]