TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_11_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-011-002-10 | FUSED_ID : 6359364768386560042
  IC_TEMP :  -64.25 | VDDM : 1109.11 | AUX_INT :  -10.58 | CsaBias :   61.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64982e-03 / 2
  ADC_P0  : -1.05815e-02 ± 2.74737e-02
  ADC_P1  : 9.07434e-03 ± 7.06470e-04
  ADC_P2  : -7.68939e-06 ± 3.61643e-06
  CSA_Chi2/NDF : 2.39197e-04 / 2
  CSA_P0  : 5.86232e-02 ± 1.03157e-02
  CSA_P1  : 1.06761e-02 ± 7.77217e-04
  CSA_P2  : -6.22561e-05 ± 1.18361e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [5, 7, 14, 18, 19, 32, 34, 46, 49, 58, 66, 69, 70, 77, 80, 86, 89, 114, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 2, 4, 26, 28, 43, 53, 66, 101, 105, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2342', '1.800', '0.1646', '1.800', '0.0865', '7.000', '0.7073', 1, 1, 1, 1, 1724699518.6008747]
VI_after__Init : ['1.201', '0.2344', '1.800', '0.1645', '1.800', '0.0806', '7.000', '0.7069', 1, 1, 1, 1, 1724699527.4390714]
VI_at__the_End : ['1.201', '0.4808', '1.800', '0.1405', '1.799', '0.1142', '7.000', '0.7080', 1, 1, 1, 1, 1724699588.1938548]