TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_41_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-011-021-13 | FUSED_ID : 6359364768386560349
  IC_TEMP :  -53.91 | VDDM : 1131.63 | AUX_INT :   -7.94 | CsaBias :   73.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25408e-03 / 2
  ADC_P0  : -7.93633e-03 ± 2.39976e-02
  ADC_P1  : 8.22922e-03 ± 5.79560e-04
  ADC_P2  : -5.65905e-06 ± 2.76766e-06
  CSA_Chi2/NDF : 1.11119e-04 / 2
  CSA_P0  : 5.68210e-02 ± 7.03099e-03
  CSA_P1  : 9.42637e-03 ± 5.29734e-04
  CSA_P2  : -4.24729e-05 ± 8.06722e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 26, 47, 55, 58, 69, 78, 82, 91, 99, 101, 105, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [3, 18, 19, 23, 42, 44, 53, 54, 65, 68, 71, 72, 81, 99, 104, 107, 113, 116, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3290', '1.800', '0.1330', '1.799', '0.0925', '7.000', '0.7076', 1, 1, 1, 1, 1724697698.5148375]
VI_after__Init : ['1.202', '0.3292', '1.800', '0.1331', '1.801', '0.0869', '7.000', '0.7073', 1, 1, 1, 1, 1724697707.3881953]
VI_at__the_End : ['1.201', '0.4810', '1.800', '0.1339', '1.804', '0.1123', '7.000', '0.7082', 1, 1, 1, 1, 1724697775.463837]