TEST_NAME : Wafer
TEST_DATE : 24_08_26-20_36_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-011-024-13 | FUSED_ID : 6359364768386560397
  IC_TEMP :  -62.66 | VDDM : 1117.63 | AUX_INT :   -9.97 | CsaBias :   58.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60151e-03 / 2
  ADC_P0  : -9.97239e-03 ± 2.71429e-02
  ADC_P1  : 8.65261e-03 ± 6.84862e-04
  ADC_P2  : -6.04160e-06 ± 3.44790e-06
  CSA_Chi2/NDF : 1.99672e-04 / 2
  CSA_P0  : 6.08387e-02 ± 9.42498e-03
  CSA_P1  : 1.03354e-02 ± 7.10104e-04
  CSA_P2  : -5.64568e-05 ± 1.08141e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 6, 18, 25, 43, 50, 62, 65, 88, 97, 99, 102, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [14, 22, 24, 49, 51, 53, 58, 74, 76, 85, 90, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3526', '1.800', '0.1129', '1.800', '0.0948', '7.000', '0.7080', 1, 1, 1, 1, 1724697411.4103475]
VI_after__Init : ['1.201', '0.3550', '1.800', '0.1129', '1.801', '0.0879', '7.000', '0.7074', 1, 1, 1, 1, 1724697419.460714]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1387', '1.807', '0.1185', '7.000', '0.7082', 1, 1, 1, 1, 1724697481.614797]