TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_15_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-003-02 | FUSED_ID : 6359364768386564146
  IC_TEMP :  -55.06 | VDDM : 1117.88 | AUX_INT :   -8.84 | CsaBias :   76.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36289e-03 / 2
  ADC_P0  : -8.83557e-03 ± 2.50043e-02
  ADC_P1  : 8.60346e-03 ± 6.24562e-04
  ADC_P2  : -6.38568e-06 ± 3.09374e-06
  CSA_Chi2/NDF : 1.21544e-04 / 2
  CSA_P0  : 5.89465e-02 ± 7.35340e-03
  CSA_P1  : 9.36480e-03 ± 5.54026e-04
  CSA_P2  : -3.99757e-05 ± 8.43716e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 12, 13, 29, 34, 48, 51, 63, 68, 83, 88, 109, 114, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [2, 28, 37, 40, 85, 91, 96, 99, 116, 117, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2711', '1.800', '0.1486', '1.800', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1724699710.9474647]
VI_after__Init : ['1.201', '0.2711', '1.800', '0.1485', '1.800', '0.0823', '7.000', '0.7072', 1, 1, 1, 1, 1724699719.0757744]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1368', '1.800', '0.1088', '7.000', '0.7079', 1, 1, 1, 1, 1724699786.739138]