TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_19_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-006-02 | FUSED_ID : 6359364768386564194
  IC_TEMP :  -56.78 | VDDM : 1116.94 | AUX_INT :   -9.84 | CsaBias :   67.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46191e-03 / 2
  ADC_P0  : -9.83636e-03 ± 2.58932e-02
  ADC_P1  : 8.63496e-03 ± 6.47406e-04
  ADC_P2  : -6.28284e-06 ± 3.22809e-06
  CSA_Chi2/NDF : 1.48377e-04 / 2
  CSA_P0  : 5.83838e-02 ± 8.12467e-03
  CSA_P1  : 1.00005e-02 ± 6.12135e-04
  CSA_P2  : -5.14224e-05 ± 9.32210e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [16, 29, 42, 47, 67, 69, 82, 95, 96, 99, 101, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 7, 10, 23, 31, 37, 38, 91, 94, 97, 104, 105, 113, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2155', '1.800', '0.1341', '1.799', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1724699998.8197284]
VI_after__Init : ['1.202', '0.2155', '1.800', '0.1342', '1.800', '0.0863', '7.000', '0.7071', 1, 1, 1, 1, 1724700006.945951]
VI_at__the_End : ['1.201', '0.4781', '1.800', '0.1373', '1.801', '0.1149', '7.000', '0.7076', 1, 1, 1, 1, 1724700065.2773013]