TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_21_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-007-02 | FUSED_ID : 6359364768386564210
  IC_TEMP :  -56.51 | VDDM : 1114.93 | AUX_INT :   -8.01 | CsaBias :   59.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05085e-03 / 2
  ADC_P0  : -8.01141e-03 ± 2.19461e-02
  ADC_P1  : 8.49433e-03 ± 5.48061e-04
  ADC_P2  : -5.81802e-06 ± 2.71744e-06
  CSA_Chi2/NDF : 1.58072e-04 / 2
  CSA_P0  : 6.17210e-02 ± 8.38590e-03
  CSA_P1  : 1.00169e-02 ± 6.31817e-04
  CSA_P2  : -5.23630e-05 ± 9.62183e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 32, 34, 43, 55, 68, 89, 112, 114, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [10, 11, 25, 34, 35, 38, 50, 53, 61, 72, 87, 94, 101, 117, 118, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1445', '1.800', '0.1572', '1.800', '0.0810', '7.000', '0.7069', 1, 1, 1, 1, 1724700095.0959918]
VI_after__Init : ['1.201', '0.1443', '1.800', '0.1564', '1.800', '0.0753', '7.000', '0.7070', 1, 1, 1, 1, 1724700103.14522]
VI_at__the_End : ['1.201', '0.4822', '1.800', '0.1374', '1.806', '0.1145', '7.000', '0.7078', 1, 1, 1, 1, 1724700162.3033805]