TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_32_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-014-02 | FUSED_ID : 6359364768386564322
  IC_TEMP :  -58.58 | VDDM : 1119.77 | AUX_INT :   -9.48 | CsaBias :   66.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49304e-03 / 2
  ADC_P0  : -9.48003e-03 ± 2.62176e-02
  ADC_P1  : 8.44705e-03 ± 6.51355e-04
  ADC_P2  : -5.52033e-06 ± 3.22753e-06
  CSA_Chi2/NDF : 1.80946e-04 / 2
  CSA_P0  : 6.04017e-02 ± 8.97214e-03
  CSA_P1  : 1.07984e-02 ± 6.75986e-04
  CSA_P2  : -6.32537e-05 ± 1.02945e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [3, 18, 24, 50, 52, 57, 60, 70, 79, 86, 87, 90, 103, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [11, 14, 36, 52, 54, 56, 66, 88, 102, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3058', '1.800', '0.1668', '1.799', '0.0906', '7.000', '0.7072', 1, 1, 1, 1, 1724700767.3102589]
VI_after__Init : ['1.201', '0.3057', '1.800', '0.1668', '1.801', '0.0848', '7.000', '0.7075', 1, 1, 1, 1, 1724700775.515574]
VI_at__the_End : ['1.201', '0.4831', '1.800', '0.1384', '1.803', '0.1144', '7.000', '0.7084', 1, 1, 1, 1, 1724700833.8041172]