TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_37_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-017-05 | FUSED_ID : 6359364768386564373
  IC_TEMP :  -67.56 | VDDM : 1123.99 | AUX_INT :   -7.69 | CsaBias :   45.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12268e-03 / 2
  ADC_P0  : -7.68937e-03 ± 2.26924e-02
  ADC_P1  : 8.84030e-03 ± 5.89472e-04
  ADC_P2  : -6.47866e-06 ± 3.03004e-06
  CSA_Chi2/NDF : 1.68414e-04 / 2
  CSA_P0  : 6.10677e-02 ± 8.65587e-03
  CSA_P1  : 1.03589e-02 ± 6.52158e-04
  CSA_P2  : -5.89049e-05 ± 9.93159e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [10, 14, 26, 39, 42, 44, 54, 57, 60, 73, 86, 112, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [26, 43, 54, 57, 60, 73, 85, 88, 89, 100, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3065', '1.800', '0.1575', '1.799', '0.0910', '7.000', '0.7076', 1, 1, 1, 1, 1724701054.8067088]
VI_after__Init : ['1.201', '0.3068', '1.800', '0.1575', '1.799', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1724701062.9090402]
VI_at__the_End : ['1.201', '0.4745', '1.800', '0.1403', '1.800', '0.1157', '7.000', '0.7086', 1, 1, 1, 1, 1724701131.4866192]