TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_45_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-022-05 | FUSED_ID : 6359364768386564453
  IC_TEMP :  -60.87 | VDDM : 1121.69 | AUX_INT :  -10.34 | CsaBias :   68.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57521e-03 / 2
  ADC_P0  : -1.03411e-02 ± 2.68663e-02
  ADC_P1  : 8.84813e-03 ± 6.82266e-04
  ADC_P2  : -6.85268e-06 ± 3.45661e-06
  CSA_Chi2/NDF : 1.74142e-04 / 2
  CSA_P0  : 6.22873e-02 ± 8.80186e-03
  CSA_P1  : 1.07305e-02 ± 6.63157e-04
  CSA_P2  : -5.96963e-05 ± 1.00991e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 3, 12, 22, 25, 26, 70, 78, 79, 85, 93, 98, 104, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 3, 19, 22, 27, 29, 56, 69, 86, 94, 96, 104, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3071', '1.800', '0.1384', '1.800', '0.0934', '7.000', '0.7078', 1, 1, 1, 1, 1724701535.1415985]
VI_after__Init : ['1.202', '0.3069', '1.800', '0.1381', '1.800', '0.0876', '7.000', '0.7076', 1, 1, 1, 1, 1724701543.2642436]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1420', '1.804', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1724701611.2295616]