TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_47_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-023-05 | FUSED_ID : 6359364768386564469
  IC_TEMP :  -57.97 | VDDM : 1122.43 | AUX_INT :   -9.13 | CsaBias :   67.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50813e-03 / 2
  ADC_P0  : -9.12921e-03 ± 2.63516e-02
  ADC_P1  : 8.60781e-03 ± 6.66393e-04
  ADC_P2  : -5.87276e-06 ± 3.35179e-06
  CSA_Chi2/NDF : 1.62909e-04 / 2
  CSA_P0  : 5.99550e-02 ± 8.51323e-03
  CSA_P1  : 1.03471e-02 ± 6.41411e-04
  CSA_P2  : -5.61838e-05 ± 9.76793e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [10, 11, 26, 39, 41, 52, 70, 75, 81, 84, 92, 115, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [13, 20, 21, 27, 33, 60, 67, 74, 76, 79, 98, 100, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3306', '1.799', '0.1412', '1.799', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1724701630.8161695]
VI_after__Init : ['1.200', '0.3307', '1.800', '0.1412', '1.800', '0.0846', '7.000', '0.7078', 1, 1, 1, 1, 1724701638.9355907]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1386', '1.800', '0.1148', '7.000', '0.7085', 1, 1, 1, 1, 1724701704.9669545]