TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_50_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-025-05 | FUSED_ID : 6359364768386564501
  IC_TEMP :  -61.49 | VDDM : 1118.06 | AUX_INT :   -8.77 | CsaBias :   66.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46236e-03 / 2
  ADC_P0  : -8.77076e-03 ± 2.59585e-02
  ADC_P1  : 8.41771e-03 ± 6.46320e-04
  ADC_P2  : -5.43256e-06 ± 3.19954e-06
  CSA_Chi2/NDF : 1.25444e-04 / 2
  CSA_P0  : 5.66579e-02 ± 7.47047e-03
  CSA_P1  : 1.00143e-02 ± 5.62846e-04
  CSA_P2  : -5.12337e-05 ± 8.57148e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [2, 3, 53, 76, 82, 84, 99, 100, 108, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 3, 18, 19, 26, 31, 34, 39, 48, 49, 62, 64, 66, 78, 88, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2286', '1.800', '0.1407', '1.800', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1724701822.9896643]
VI_after__Init : ['1.201', '0.2286', '1.800', '0.1407', '1.800', '0.0820', '7.000', '0.7076', 1, 1, 1, 1, 1724701831.2329743]
VI_at__the_End : ['1.201', '0.4795', '1.800', '0.1371', '1.804', '0.1156', '7.000', '0.7086', 1, 1, 1, 1, 1724701891.3226683]