TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_51_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-012-026-05 | FUSED_ID : 6359364768386564517
  IC_TEMP :  -49.51 | VDDM : 1218.87 | AUX_INT : -1320.03 | CsaBias : -894.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.93047e-02 / 2
  ADC_P0  : -1.32003e+00 ± 6.92845e-01
  ADC_P1  : 2.77242e-02 ± 1.26658e-02
  ADC_P2  : -7.17093e-05 ± 4.93007e-05
  CSA_Chi2/NDF : 1.26748e-04 / 2
  CSA_P0  : 5.94265e-02 ± 7.50918e-03
  CSA_P1  : 9.64482e-03 ± 5.65763e-04
  CSA_P2  : -4.34342e-05 ± 8.61590e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 38, 54, 60, 65, 70, 78, 80, 81, 90, 101, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [25, 27, 30, 43, 47, 54, 74, 90, 96, 120, 123, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1978', '1.800', '0.1581', '1.800', '0.0886', '7.000', '0.7078', 1, 1, 1, 1, 1724701919.3096695]
VI_after__Init : ['1.201', '0.1978', '1.800', '0.1580', '1.800', '0.0829', '7.000', '0.7076', 1, 1, 1, 1, 1724701927.3761024]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1338', '1.800', '0.1117', '7.000', '0.7087', 1, 1, 1, 1, 1724701992.4913313]