TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_31_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-003-15 | FUSED_ID : 6359364768386568255
  IC_TEMP :  -59.31 | VDDM : 1135.40 | AUX_INT : -169.02 | CsaBias :  -64.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01127e-03 / 2
  ADC_P0  : -1.69020e-01 ± 2.86661e-02
  ADC_P1  : 1.17645e-02 ± 7.08845e-04
  ADC_P2  : -1.74797e-05 ± 3.44759e-06
  CSA_Chi2/NDF : 1.58152e-04 / 2
  CSA_P0  : 5.99400e-02 ± 8.38801e-03
  CSA_P1  : 9.91343e-03 ± 6.31976e-04
  CSA_P2  : -4.92435e-05 ± 9.62425e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [1, 6, 9, 39, 56, 77, 80, 86, 94, 108, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [21, 26, 31, 42, 49, 80, 83, 97, 100, 106, 107, 108, 109, 110, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1969', '1.800', '0.1561', '1.800', '0.0914', '7.000', '0.7085', 1, 1, 1, 1, 1724704302.608795]
VI_after__Init : ['1.201', '0.1970', '1.800', '0.1561', '1.800', '0.0844', '7.000', '0.7077', 1, 1, 1, 1, 1724704310.7192411]
VI_at__the_End : ['1.201', '0.4837', '1.800', '0.1373', '1.800', '0.1137', '7.000', '0.7083', 1, 1, 1, 1, 1724704378.7859428]