TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_28_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-005-15 | FUSED_ID : 6359364768386568287
  IC_TEMP :  -55.03 | VDDM : 1123.23 | AUX_INT :   -7.41 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06790e-03 / 2
  ADC_P0  : -7.41417e-03 ± 2.21190e-02
  ADC_P1  : 8.33814e-03 ± 5.40463e-04
  ADC_P2  : -5.91896e-06 ± 2.60884e-06
  CSA_Chi2/NDF : 1.14645e-04 / 2
  CSA_P0  : 5.67885e-02 ± 7.14167e-03
  CSA_P1  : 9.32614e-03 ± 5.38073e-04
  CSA_P2  : -4.13875e-05 ± 8.19422e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 8, 12, 36, 54, 64, 67, 71, 75, 91, 98, 108, 110, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 44, 55, 58, 69, 70, 72, 93, 102, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1439', '1.800', '0.1728', '1.800', '0.0819', '7.000', '0.7076', 1, 1, 1, 1, 1724704110.7735703]
VI_after__Init : ['1.201', '0.1440', '1.800', '0.1727', '1.801', '0.0761', '7.000', '0.7078', 1, 1, 1, 1, 1724704119.4958506]
VI_at__the_End : ['1.198', '0.4763', '1.800', '0.1388', '1.800', '0.1130', '7.000', '0.7084', 1, 1, 1, 1, 1724704184.4819484]