TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_26_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-006-15 | FUSED_ID : 6359364768386568303
  IC_TEMP :  -56.82 | VDDM : 1125.89 | AUX_INT :   -8.02 | CsaBias :   67.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14145e-03 / 2
  ADC_P0  : -8.01531e-03 ± 2.29398e-02
  ADC_P1  : 8.45087e-03 ± 5.85326e-04
  ADC_P2  : -4.68752e-06 ± 2.97866e-06
  CSA_Chi2/NDF : 1.88911e-04 / 2
  CSA_P0  : 6.03997e-02 ± 9.16749e-03
  CSA_P1  : 1.02932e-02 ± 6.90705e-04
  CSA_P2  : -5.63106e-05 ± 1.05186e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 24, 64, 65, 73, 82, 88, 101, 107, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [8, 31, 46, 60, 77, 79, 80, 83, 88, 91, 95, 98, 121, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3205', '1.800', '0.1850', '1.800', '0.0889', '7.000', '0.7077', 1, 1, 1, 1, 1724704015.1978474]
VI_after__Init : ['1.201', '0.3207', '1.800', '0.1852', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1724704023.2373621]
VI_at__the_End : ['1.201', '0.4811', '1.800', '0.1419', '1.799', '0.1142', '7.000', '0.7084', 1, 1, 1, 1, 1724704089.7972538]