TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_25_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-007-15 | FUSED_ID : 6359364768386568319
  IC_TEMP :  -57.81 | VDDM : 1106.09 | AUX_INT :  -11.39 | CsaBias :   67.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.07725e-03 / 2
  ADC_P0  : -1.13929e-02 ± 3.09028e-02
  ADC_P1  : 8.81257e-03 ± 7.75637e-04
  ADC_P2  : -6.97924e-06 ± 3.88208e-06
  CSA_Chi2/NDF : 1.68315e-04 / 2
  CSA_P0  : 6.00153e-02 ± 8.65335e-03
  CSA_P1  : 1.01250e-02 ± 6.51967e-04
  CSA_P2  : -5.24096e-05 ± 9.92869e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 25, 27, 29, 34, 59, 60, 80, 87, 98, 100, 106, 116, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [9, 17, 31, 40, 45, 52, 55, 65, 81, 100, 105, 106, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1519', '1.800', '0.1705', '1.800', '0.0824', '7.000', '0.7078', 1, 1, 1, 1, 1724703919.5423002]
VI_after__Init : ['1.201', '0.1520', '1.800', '0.1706', '1.800', '0.0768', '7.000', '0.7077', 1, 1, 1, 1, 1724703928.2905986]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1382', '1.800', '0.1138', '7.000', '0.7085', 1, 1, 1, 1, 1724703989.4009008]