TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_23_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-008-15 | FUSED_ID : 6359364768386568335
  IC_TEMP :  -57.74 | VDDM : 1122.46 | AUX_INT :   -7.24 | CsaBias :   68.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.57459e-04 / 2
  ADC_P0  : -7.24321e-03 ± 1.98088e-02
  ADC_P1  : 8.42623e-03 ± 4.92995e-04
  ADC_P2  : -5.66683e-06 ± 2.43295e-06
  CSA_Chi2/NDF : 1.73781e-04 / 2
  CSA_P0  : 5.83858e-02 ± 8.79274e-03
  CSA_P1  : 1.02758e-02 ± 6.62469e-04
  CSA_P2  : -5.38447e-05 ± 1.00886e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [11, 12, 20, 45, 60, 69, 82, 91, 101, 115, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [4, 5, 9, 24, 28, 36, 45, 53, 81, 90, 93, 99, 104, 109, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4756', '1.800', '0.1255', '1.800', '0.0962', '7.000', '0.7076', 1, 1, 1, 1, 1724703823.9206307]
VI_after__Init : ['1.201', '0.4760', '1.800', '0.1256', '1.800', '0.0907', '7.000', '0.7078', 1, 1, 1, 1, 1724703831.994081]
VI_at__the_End : ['1.201', '0.4874', '1.800', '0.1395', '1.800', '0.1132', '7.000', '0.7086', 1, 1, 1, 1, 1724703900.2797623]