TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_22_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-009-15 | FUSED_ID : 6359364768386568351
  IC_TEMP :  -60.62 | VDDM : 1116.50 | AUX_INT :   -9.62 | CsaBias :   60.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43965e-03 / 2
  ADC_P0  : -9.62462e-03 ± 2.57044e-02
  ADC_P1  : 8.78654e-03 ± 6.56485e-04
  ADC_P2  : -6.37419e-06 ± 3.34253e-06
  CSA_Chi2/NDF : 2.09304e-04 / 2
  CSA_P0  : 6.07852e-02 ± 9.64963e-03
  CSA_P1  : 1.05349e-02 ± 7.27030e-04
  CSA_P2  : -5.87015e-05 ± 1.10718e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [28, 35, 51, 53, 57, 65, 70, 79, 81, 87, 92, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 19, 23, 36, 47, 55, 59, 62, 95, 100, 103, 108, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2974', '1.800', '0.1540', '1.800', '0.0964', '7.000', '0.7076', 1, 1, 1, 1, 1724703727.664014]
VI_after__Init : ['1.201', '0.2973', '1.800', '0.1541', '1.800', '0.0908', '7.000', '0.7078', 1, 1, 1, 1, 1724703735.735497]
VI_at__the_End : ['1.201', '0.4867', '1.800', '0.1413', '1.800', '0.1152', '7.000', '0.7086', 1, 1, 1, 1, 1724703803.054235]