TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_18_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-011-15 | FUSED_ID : 6359364768386568383
  IC_TEMP :  -57.89 | VDDM : 1130.79 | AUX_INT :   -8.74 | CsaBias :   69.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17140e-03 / 2
  ADC_P0  : -8.73717e-03 ± 2.31682e-02
  ADC_P1  : 8.70076e-03 ± 5.89623e-04
  ADC_P2  : -6.13572e-06 ± 2.98765e-06
  CSA_Chi2/NDF : 1.65889e-04 / 2
  CSA_P0  : 6.11885e-02 ± 8.59074e-03
  CSA_P1  : 1.03518e-02 ± 6.47250e-04
  CSA_P2  : -5.47968e-05 ± 9.85686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [7, 10, 15, 25, 29, 46, 50, 80, 90, 94, 100, 102, 106, 119, 126]
 | N_BROKEN_SLOW :  [2]
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 19, 41, 51, 54, 69, 73, 77, 85, 117, 118, 122, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3246', '1.800', '0.1422', '1.800', '0.0943', '7.000', '0.7077', 1, 1, 1, 1, 1724703535.5519118]
VI_after__Init : ['1.202', '0.3248', '1.800', '0.1423', '1.800', '0.0891', '7.000', '0.7077', 1, 1, 1, 1, 1724703543.808319]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1411', '1.800', '0.1141', '7.000', '0.7084', 1, 1, 1, 1, 1724703612.2540042]