TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_15_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-013-15 | FUSED_ID : 6359364768386568415
  IC_TEMP :  -57.78 | VDDM : 1103.60 | AUX_INT :  -10.37 | CsaBias :   66.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72173e-03 / 2
  ADC_P0  : -1.03721e-02 ± 2.80941e-02
  ADC_P1  : 8.57668e-03 ± 6.86005e-04
  ADC_P2  : -6.79357e-06 ± 3.32940e-06
  CSA_Chi2/NDF : 1.60339e-04 / 2
  CSA_P0  : 5.99066e-02 ± 8.44581e-03
  CSA_P1  : 1.00500e-02 ± 6.36331e-04
  CSA_P2  : -5.02422e-05 ± 9.69057e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [28, 33, 34, 52, 57, 90, 98, 100, 118, 120, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 31, 50, 56, 60, 74, 87, 96, 105, 107, 120, 122, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4434', '1.800', '0.1694', '1.800', '0.1021', '7.000', '0.7076', 1, 1, 1, 1, 1724703344.5105958]
VI_after__Init : ['1.201', '0.4440', '1.800', '0.1695', '1.800', '0.0961', '7.000', '0.7077', 1, 1, 1, 1, 1724703352.640024]
VI_at__the_End : ['1.201', '0.4893', '1.800', '0.1380', '1.800', '0.1140', '7.000', '0.7084', 1, 1, 1, 1, 1724703419.7988436]