TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_09_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-017-08 | FUSED_ID : 6359364768386568472
  IC_TEMP :  -55.57 | VDDM : 1122.70 | AUX_INT :   -9.50 | CsaBias :   69.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47309e-03 / 2
  ADC_P0  : -9.49863e-03 ± 2.59844e-02
  ADC_P1  : 8.82663e-03 ± 6.59254e-04
  ADC_P2  : -7.02319e-06 ± 3.31790e-06
  CSA_Chi2/NDF : 1.52425e-04 / 2
  CSA_P0  : 5.79103e-02 ± 8.23476e-03
  CSA_P1  : 1.00504e-02 ± 6.20430e-04
  CSA_P2  : -4.99495e-05 ± 9.44841e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 14, 15, 24, 31, 32, 35, 82, 87, 99, 109, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 9, 17, 59, 71, 110, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2599', '1.800', '0.1320', '1.800', '0.0844', '7.000', '0.7077', 1, 1, 1, 1, 1724702967.2273135]
VI_after__Init : ['1.201', '0.2600', '1.800', '0.1321', '1.800', '0.0795', '7.000', '0.7079', 1, 1, 1, 1, 1724702975.3177152]
VI_at__the_End : ['1.201', '0.4885', '1.800', '0.1380', '1.800', '0.1128', '7.000', '0.7085', 1, 1, 1, 1, 1724703040.4937692]