TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_07_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-018-08 | FUSED_ID : 6359364768386568488
  IC_TEMP :  -54.62 | VDDM : 1125.80 | AUX_INT :   -9.34 | CsaBias :   68.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46749e-03 / 2
  ADC_P0  : -9.34137e-03 ± 2.59178e-02
  ADC_P1  : 8.67150e-03 ± 6.41802e-04
  ADC_P2  : -7.06793e-06 ± 3.14626e-06
  CSA_Chi2/NDF : 1.15885e-04 / 2
  CSA_P0  : 6.17134e-02 ± 7.18019e-03
  CSA_P1  : 9.68447e-03 ± 5.40975e-04
  CSA_P2  : -4.51341e-05 ± 8.23841e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 32, 33, 45, 61, 69, 74, 76, 78, 94, 96, 102, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [14, 18, 38, 41, 45, 49, 64, 70, 75, 96, 108, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3326', '1.800', '0.1256', '1.800', '0.0917', '7.000', '0.7078', 1, 1, 1, 1, 1724702871.543552]
VI_after__Init : ['1.201', '0.3327', '1.800', '0.1254', '1.800', '0.0863', '7.000', '0.7078', 1, 1, 1, 1, 1724702880.2519517]
VI_at__the_End : ['1.201', '0.4878', '1.800', '0.1393', '1.800', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1724702946.2558901]