TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_59_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-023-08 | FUSED_ID : 6359364768386568568
  IC_TEMP :  -51.17 | VDDM : 1126.29 | AUX_INT :   -7.33 | CsaBias :   75.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10403e-03 / 2
  ADC_P0  : -7.32806e-03 ± 2.25549e-02
  ADC_P1  : 8.28325e-03 ± 5.62704e-04
  ADC_P2  : -4.83847e-06 ± 2.78553e-06
  CSA_Chi2/NDF : 1.73199e-04 / 2
  CSA_P0  : 5.69386e-02 ± 8.77799e-03
  CSA_P1  : 9.87485e-03 ± 6.61358e-04
  CSA_P2  : -4.79007e-05 ± 1.00717e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [10, 25, 29, 42, 59, 69, 75, 81, 82, 85, 106, 108, 113, 114, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [3, 11, 31, 35, 39, 45, 50, 52, 68, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3603', '1.800', '0.1446', '1.800', '0.0950', '7.000', '0.7078', 1, 1, 1, 1, 1724702392.8866956]
VI_after__Init : ['1.201', '0.3603', '1.800', '0.1445', '1.800', '0.0892', '7.000', '0.7078', 1, 1, 1, 1, 1724702400.9680645]
VI_at__the_End : ['1.201', '0.4897', '1.800', '0.1369', '1.800', '0.1118', '7.000', '0.7087', 1, 1, 1, 1, 1724702470.0248668]