TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_58_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-024-08 | FUSED_ID : 6359364768386568584
  IC_TEMP :  -55.06 | VDDM : 1124.60 | AUX_INT :   -8.84 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36289e-03 / 2
  ADC_P0  : -8.83557e-03 ± 2.50043e-02
  ADC_P1  : 8.60346e-03 ± 6.24562e-04
  ADC_P2  : -6.38568e-06 ± 3.09374e-06
  CSA_Chi2/NDF : 1.37395e-04 / 2
  CSA_P0  : 5.82118e-02 ± 7.81820e-03
  CSA_P1  : 9.90748e-03 ± 5.89045e-04
  CSA_P2  : -4.61471e-05 ± 8.97046e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  45
 | N_BROKEN_FAST :  [2, 6, 15, 16, 17, 19, 23, 27, 29, 31, 37, 41, 44, 60, 62, 70, 77, 93, 96, 112, 125]
 | N_BROKEN_SLOW :  [1, 2, 3, 5, 6, 15, 18, 19, 23, 27, 31, 39, 40, 53, 57, 74, 77, 78, 82, 86, 90, 93, 94, 125]
   P_BROKEN_DISC :  54
 | P_BROKEN_FAST :  [0, 2, 5, 6, 16, 17, 21, 39, 40, 41, 43, 47, 49, 51, 55, 56, 59, 70, 75, 77, 93, 96, 108, 118, 125, 126]
 | P_BROKEN_SLOW :  [2, 5, 6, 16, 17, 39, 40, 43, 47, 51, 55, 59, 63, 68, 75, 76, 77, 82, 83, 86, 87, 90, 91, 94, 99, 103, 125, 126]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4921', '1.800', '0.1576', '1.799', '0.1064', '7.000', '0.7079', 1, 1, 1, 1, 1724702297.2768688]
VI_after__Init : ['1.201', '0.4929', '1.800', '0.1577', '1.800', '0.1006', '7.000', '0.7079', 1, 1, 1, 1, 1724702305.3622074]
VI_at__the_End : ['1.201', '0.4931', '1.800', '0.1386', '1.799', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1724702365.21674]