TEST_NAME : Wafer
TEST_DATE : 24_08_26-21_55_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-013-026-08 | FUSED_ID : 6359364768386568616
  IC_TEMP :  -58.32 | VDDM : 1127.47 | AUX_INT :   -7.76 | CsaBias :   76.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26058e-03 / 2
  ADC_P0  : -7.76295e-03 ± 2.40845e-02
  ADC_P1  : 8.51253e-03 ± 6.08233e-04
  ADC_P2  : -5.68941e-06 ± 3.04161e-06
  CSA_Chi2/NDF : 1.13054e-04 / 2
  CSA_P0  : 5.89286e-02 ± 7.09195e-03
  CSA_P1  : 9.72983e-03 ± 5.34327e-04
  CSA_P2  : -4.37292e-05 ± 8.13717e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [5, 9, 11, 25, 31, 32, 35, 60, 75, 81, 86, 90, 96, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 23, 51, 56, 58, 59, 62, 63, 76, 77, 89, 110, 113, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2409', '1.800', '0.1565', '1.800', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1724702104.5121403]
VI_after__Init : ['1.202', '0.2410', '1.800', '0.1567', '1.799', '0.0842', '7.000', '0.7076', 1, 1, 1, 1, 1724702113.2584083]
VI_at__the_End : ['1.201', '0.4936', '1.800', '0.1365', '1.803', '0.1122', '7.000', '0.7085', 1, 1, 1, 1, 1724702175.2548635]