TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_36_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-005-01 | FUSED_ID : 6359364768386572369
  IC_TEMP :  -54.43 | VDDM : 1125.70 | AUX_INT :   -7.84 | CsaBias :   81.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27911e-03 / 2
  ADC_P0  : -7.84419e-03 ± 2.43114e-02
  ADC_P1  : 8.15603e-03 ± 6.01346e-04
  ADC_P2  : -4.29869e-06 ± 2.96099e-06
  CSA_Chi2/NDF : 2.06823e-04 / 2
  CSA_P0  : 5.89978e-02 ± 9.59227e-03
  CSA_P1  : 9.87181e-03 ± 7.22709e-04
  CSA_P2  : -5.01532e-05 ± 1.10060e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 25, 34, 43, 53, 70, 71, 77, 88, 96, 106, 113, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 13, 22, 41, 59, 71, 90, 123, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3514', '1.800', '0.1527', '1.800', '0.0886', '7.000', '0.7084', 1, 1, 1, 1, 1724704589.5788138]
VI_after__Init : ['1.202', '0.3519', '1.800', '0.1530', '1.800', '0.0808', '7.000', '0.7075', 1, 1, 1, 1, 1724704598.4821863]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1351', '1.800', '0.1128', '7.000', '0.7082', 1, 1, 1, 1, 1724704664.9561243]