TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_39_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-007-01 | FUSED_ID : 6359364768386572401
  IC_TEMP :  -55.35 | VDDM : 1127.87 | AUX_INT :   -7.83 | CsaBias :   60.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12917e-03 / 2
  ADC_P0  : -7.83415e-03 ± 2.27348e-02
  ADC_P1  : 8.53537e-03 ± 5.64063e-04
  ADC_P2  : -6.42689e-06 ± 2.76532e-06
  CSA_Chi2/NDF : 1.70995e-04 / 2
  CSA_P0  : 6.11261e-02 ± 8.72195e-03
  CSA_P1  : 9.96386e-03 ± 6.57136e-04
  CSA_P2  : -4.89586e-05 ± 1.00074e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [1, 5, 6, 7, 8, 13, 29, 37, 44, 46, 52, 96, 101, 102, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 4, 19, 25, 47, 58, 70, 84, 87, 97, 99, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2271', '1.800', '0.1564', '1.800', '0.0817', '7.000', '0.7077', 1, 1, 1, 1, 1724704781.2241652]
VI_after__Init : ['1.202', '0.2273', '1.800', '0.1565', '1.800', '0.0765', '7.000', '0.7076', 1, 1, 1, 1, 1724704789.3545403]
VI_at__the_End : ['1.201', '0.4925', '1.800', '0.1385', '1.800', '0.1129', '7.000', '0.7084', 1, 1, 1, 1, 1724704849.9498692]