TEST_NAME : Wafer
TEST_DATE : 24_08_26-22_47_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-014-012-01 | FUSED_ID : 6359364768386572481
  IC_TEMP :  -55.32 | VDDM : 1136.85 | AUX_INT :   -6.41 | CsaBias :   83.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53087e-04 / 2
  ADC_P0  : -6.41270e-03 ± 2.09342e-02
  ADC_P1  : 8.22908e-03 ± 5.18738e-04
  ADC_P2  : -4.94621e-06 ± 2.54133e-06
  CSA_Chi2/NDF : 1.12393e-04 / 2
  CSA_P0  : 5.99302e-02 ± 7.07118e-03
  CSA_P1  : 9.75296e-03 ± 5.32762e-04
  CSA_P2  : -4.48261e-05 ± 8.11334e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 11, 57, 71, 72, 80, 101, 108, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 20, 43, 50, 53, 56, 65, 68, 78, 83, 102, 113, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3855', '1.800', '0.1485', '1.799', '0.0933', '7.000', '0.7076', 1, 1, 1, 1, 1724705261.6512454]
VI_after__Init : ['1.201', '0.3857', '1.800', '0.1485', '1.800', '0.0876', '7.000', '0.7076', 1, 1, 1, 1, 1724705269.728628]
VI_at__the_End : ['1.201', '0.4944', '1.800', '0.1399', '1.807', '0.1122', '7.000', '0.7083', 1, 1, 1, 1, 1724705330.4730372]